Target segments
Back-end Final Test
Wafer Test
PCM Test
High performance
Near-zero footprint (213 x 440 mm)
Ultra-short test times — increasing UPH
Highest accuracy in the market
Extreme flexibility
Multiple configurations possible with
1 booster controller (nTHBC)
Up to 4 test heads (nSBTH) with 6 channels
Fast Kelvin check without switching relays
Ultra-fast leakage test
Pin electronics
Multi-site testing
Optional SECS/GEM interface following SEMI standard
Embedded software
User-definable parameters
Visual ITEC: user-definable operator interface
Automatic multi-site expansion
Scope function
V and I waveforms and timing on all channels
Real-time diagnostics
Curve traces
Extendable Software
Equipment control for multiple test cells
Post-processing
Dynamic Part Average Test
Static Part Average Test
Moving Limits
Nearest neighbourhood residual
DIE BONDER / DIE SORTER
Eliminate long test times and high-test costs
The most advanced modular parameter test system for discrete semiconductors up to 6 or 12 leads. With ultra-short test times, this tester is capable of testing up to 92.000 devices per hour with a single test handler — the fastest test cell on the market. This tester can be used as a wafer tester, a PCM tester and as a final tester in the back-end. nanoParset occupies minimal floor space. Up to four test heads can be combined as one to test 24-pin packages at the highest possible throughput. Fast Kelvin checks without switching relays to prevent breakage.
Maximum supply and current per channel
400 V / 3 A
Small footprint
Test Head: 125 x 540 x 375 mm
Booster: 213 x 440 x 875 mm
Other
Extendable test heads for adding handlers (up to 2 handlers)
Maximum: 12 leads
Voltage: 220 - 240 VAC +/- 5%, 1-phase
Current: Fused on 16 A
Frequency: 50 / 60 Hz +/- 0.5 Hz
Handler Interface: GPIB, TTL, RS232, TCP/IP
Optional SECS/GEM interface following SEMI standard
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