Application
Inspection of lead-frame substrate to detect post-die bond and wire bond defect
Key features
High-speed fully auto wire loop/profile inspection
Min 5 MP camera for 3D inspection
Laser cut option for reject handling
Post-inspection after reject laser handling
Inspection Time: 7 µm resolution with 4cm/second
SEMI standard with SECS/GEM interface
Sophisticated defect mode classification
Lead frame width 17 mm to 32 mm
AOI cellular network architecture for recipe and e-Map management
Option: real-time data feeding to MES and eSPC
Option: auto email alert (defect/batch summary)