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Power μParset Discrete tester
The Power µParset Discrete Tester can test power discretes up to 400 V @ 30 A per channel and has the quickest test times in the market. Its modular design means that it can test devices up to 2 kV @ 200 A.
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μParset Discrete Tester
Versatile hardware and software make the µParset DiscreteTester suitable for all wafer testing, final testing, acceptance or quality testing, and device characterization.
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Nanoparset Discrete Tester
The nanoParset Discrete Tester can test up to 90,000 devices per hour when combined with a dual-track handler — making it the fastest on the market. It can be used as a wafer tester, PCM (Process Control Monitoring) tester, and as a final back-end tester. Up to four test heads can be combined as one, to test 24-pin devices at the highest possible throughput.