Eliminates lengthy test times

Gain short tester times and increase production at a lower total cost of ownership. Built as a modular parameter test system for discrete semiconductor devices with up to 12 leads, the Discrete High-Volume Tester enables high throughput. Flexible hardware and software make the Tester suitable for all wafer testing, final testing, acceptance or quality testing, and device characterization tasks. µPARSET software gathers data about measured devices and produces various insights. It is handler and prober agnostic, equipped to connect to any prober or tester. High accuracy leads to a narrow spread in test results and better products. It can connect up to four handlers when floor space is limited.