Eliminate long test times and high-test costs

The most advanced modular parameter test system for discrete semiconductors up to 6 or 12 leads. With ultra-short test times, this tester is capable of testing up to 92.000 devices per hour with a single test handler — the fastest test cell on the market. This tester can be used as a wafer tester, a PCM tester and as a final tester in the back-end. nanoParset occupies minimal floor space. Up to four test heads can be combined as one to test 24-pin packages at the highest possible throughput. Fast Kelvin checks without switching relays to prevent breakage.