中文
.png)
The benchmark in analog power testing
Eliminate power products’ lengthy test times for enhanced output. This is the modular parameter test system for power discrete semiconductor devices up to 12 leads. The standard configuration has a maximum supply and current per channel of 400V and 30A. Through its modular architecture, this can be extended with a high voltage unit of 2kV and a high current unit of 200A. µPARSET software gathers data about measured devices and produces various insights for product quality, stability, and yield optimization.
Target segments
Back-end final test
Wafer test
High performance
Handler and prober interface
1 to 4 handlers
Multi-site testing
Short test times
Pin electronics (voltage and current measurement on all pins simultaneously)
Maximum number of pins: (FT and AT/QT): 6 or 12 pins
High-quality diagnostics and calibration
High accuracy
User-definable parameters
Test heads
Current amplifier for fast leakage measurement
Short and open pins close to DUT
Dedicated test hardware
Embedded software
User-definable parameters
Visual ITEC: user-definable operator interface
Automatic multi-site expansion
ITEC Scope function
V and I waveforms and timing on all channels
Real-time diagnostics
Curve traces
Extendable software
Equipment control for multiple test cells
Post-processing
Dynamic Part Average Test
Static Part Average Test
Moving Limits
Nearest neighbourhood residual
Optional extension modules
Qs: reverse recovery charge (30 nC / 300 nC / 3 uC)
Gate resistance and capacitance (Rg/Cg) extension
µPHV: high voltage test (2 kV)
µPHC: high current unit (200 A)
µPDI: digital interface 2 x 16 channels fully floating
SECS/GEM interface
Maximum supply and current per channel
400 V / 30 A
Small footprint
600 x 665 x 1235mm
Other
Extendable test heads for adding handlers
Maximum: 12 leads
Voltage: 220-240 VAC +/- 5%, 1-phase
Current: Fused on 16 A
Frequency: 50/60 Hz +/- 0.5 Hz
Handler Interface: GPIB, TTL, RS232, TCP/IP
Optional SECS/GEM interface following SEMI standard